CHIP SHINE ELECTRONICS TECHNOLOGY CO., LTD
 中文
Home
"
   About
Company IntroductionQuality ManagementCorporate CultureBusiness PartnersNewsCompany Certificate
    New Product
   PRODUCT CENTER
POGO PINICT Test ProbeHigh Frequency Test ProbeSolar Panel Test ProbeTEST MODULESpecial Probes
   Technology
ICT TestingRF TestingVery Fine Pitch
   Development
MechanicalElectrical PropertiesMechanical CapacityKnowledge Center
    Contact
Home
Home
"
About
Company IntroductionQuality ManagementCorporate CultureBusiness PartnersNewsCompany Certificate
New Product
PRODUCT CENTER
POGO PINICT Test ProbeHigh Frequency Test ProbeSolar Panel Test ProbeTEST MODULESpecial Probes
Technology
ICT TestingRF TestingVery Fine Pitch
Development
MechanicalElectrical PropertiesMechanical CapacityKnowledge Center
Contact

Technical Superiority

Very Fine Test Sol...
Murata Test Soluti...
I-PEX Test Solutio...
OSP Test
Pad Test
More

Contact Us

Welcome all forms of media and business cooperation
Address:league #60792 Irvine, CA 92602, USA.
Tel:(949) 536-5268
Mail:info@chipshine.com

More
Current Position: Home > Technical Superiority >
2021/12/20
Probe Design

Tips:9-point Crown(I head)  used for small pad

       4-point Crown(H head)  used for small pad
       Sharp head(W,WN,S,A)  used for Via hole & big pad
       8-blade head (Z,ZH)  used for DIP  
About US
Company IntroductionQuality ManagementCorporate CultureBusiness Partners
News
Company News Industry News
Join US
Job Opportunities
PAYMENT TYPE


CONTACT US

TELEPHONE

(949) 536-5268
league #60792 Irvine, CA 92602, USA.
Mail：info@chipshine.com
ChipShine.com ©Copyright © 2016-2024 Chip Shine Electronics Technologies Co.,Ltd. 沪ICP备16053065号-1 CHIP SHINE ELECTRONICS TECHNOLOGY CO., LTD Copyright