CHIP SHINE ELECTRONICS TECHNOLOGY CO., LTD
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2021/12/20
Development Course

Aug. 2002:Chip Shine established

Oct. 2002:CS R&D laboratory established

Aug. 2003:Introduced foreign technology

Feb. 2005:Developed new product pad on trance for Agilent test

May.2006:Developed new product Bead probe which reduced test cost greatly

May.2007:Developed new product double cross probe

Apr. 2008:Developed new product pneumatically connected receptacle

Sep. 2010:Established a Sino-foreign joint venture Chip Shine Taicang

Nov. 2012:50mil,75mil, 100mil IF09 were innovated for testing double pads on trance

Feb. 2014:P-Probe series were developed for Watch test

Sep. 2015:P-Pin series were developed for Phone RF test

Sep. 2016:Wholly owned Chip Shine Taicang

Mar. 2017:CSRF was specially established for designing and support RF customers

Oct. 2017:TRC First Generation for Vehicle antenna test

Sep. 2018:RF test probe solution for Fakra test

May. 2019:We developed new 5G communication test solution

2002~2019:Acquisition of 23 patents