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独立温控老化测试座独立温控老化测试座
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Price:
1~100:
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5000~10000:
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Product description
Download
Probe Spec:
Material Spec:
特点：
1、旋钮压盖式设计供手工或自动载卸芯片
2、 可凭视觉准确地装载芯片
3、 可靠性高，探针预先加载
4、 测试温度范围-55~150℃
5、 独立温控，可调节芯片测试温度
.
Pitch
0.9mm
电性能
电压
100V d.c
电流
3A
介质耐电压
1000V a.c
接触电阻
100mΩ（AVG）
绝缘电阻
≥5000MΩ
芯片功耗
150W
寿命
3000小时
工作温度
-55~150℃
材质
散热
紫铜
测试盖
AL6061
主体
陶瓷PEEK
探针
BeCu
nothing
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