Chat
Guestbook
CHIP SHINE ELECTRONICS TECHNOLOGY CO., LTD
中文
Home
"
About
Company Introduction
Quality Management
Corporate Culture
Business Partners
News
New Product
PRODUCT CENTER
POGO PIN
ICT Test Probe
High Frequency Test Probe
Solar Panel Test Probe
TEST MODULE
Special Probes
Technology
ICT Testing
RF Testing
Very Fine Pitch
Development
Mechanical
Electrical Properties
Mechanical Capacity
Knowledge Center
Contact
Home
Home
"
About
Company Introduction
Quality Management
Corporate Culture
Business Partners
News
New Product
PRODUCT CENTER
POGO PIN
ICT Test Probe
High Frequency Test Probe
Solar Panel Test Probe
TEST MODULE
Special Probes
Technology
ICT Testing
RF Testing
Very Fine Pitch
Development
Mechanical
Electrical Properties
Mechanical Capacity
Knowledge Center
Contact
Contact Service
Loading…
返回列表
Current Position:
Home
>
Product Center
2D
3D
Loading…
IGBT模组测试座IGBT模组测试座
库存:0
Price:
1~100:
0.00
100~1000:
0.00
1000~5000:
0.00
5000~10000:
0.00
Product description
Download
Probe Spec:
Mininum Center:
3.0mm
FullStroke:
1.6mm
Recommended Stroke:
1.2mm
Spring Force:
300g Per pin
Impedance:
<10mΩ
Current:
瞬态电流300A(50us)
Bandwidth:
N/A
Temperature:
-55°C~150°C
Spring Life:
10万次
Material Spec:
:
BeCu+Au plated
Bottom Plunger:
BeCu+Au plated
Spring:
SUS/Music wire+Au Plate
Barrel:
Brass +Au plate
nothing
提示
确定